Optical Thin Film Lab
location: Everlight Building, Room 1028
phone: +886-2-27712171 ext 4689
|
Introduction
The Optical Thin Film Lab. of Electro-Optical Engineering of the National Taipei University of Technology (NTUT), founded in August 2002 in Taiwan. The establishment of the Lab. was part of the national attempt at promoting research and education in the fields of Optical Thin Film and engineering in Taiwan.
|
Overview
|
Research Area
- Optical thin film design theory:
- Antireflection coatings
- Neutral mirrors and beam splitters
- Multilayer high-reflectance coatings
- Edge filters
- Band-pass filters
- Tilter coatings
- Anisotropic optical thin films:
- Propagation equation in biaxial media
- Basis Vectors in biaxial media
- Transfer matrices in biaxial media
- Reflection and transmission
- Ellipsometry:
- Polarization of monochromatic waves of arbitrary spatial structure
- Representation of the polarization states of light by complex numbers
- Polarizing optical systems
- The Jones-matrix formulation
- Transformation of polarization by an optical system in the Poincare'-sphere representation
- Surface plasma:
- Dispersion relation, extension and propagation length for the electromagnetic fields of the surface plasmons
- Excitation of surface plasmons by electrons and by light
- Internal and radiation damping
- Field enhancement due to surface plasmons
- Scattering and EMA:
- The effective medium theory 「Maxwell-Garnett and Bruggeman Model」:
- The existing modifications of Effective Medium theories(EM), such as Maxwell-Garnett(MG) or Bruggemann are established for essentially random structures and could be highly inaccurate for regular or partly ordered arrays.
- Discrete-dipole approximation:
The discrete-dipole approximation(DDA) for scattering calculations, computing scattering and absorption by isolated, homogeneous spheres as well as by targets consisting of two contiguous spheres. It is shown that for dielectric or metal materials, the DDA permits calculations of scattering and absorption that are accurate to within a few percent.
- Absorption and scattering by an arbitrary particle
- FDTD simulation
- Analytical absorbing boundary conditions
- Perfectly matched layer absorbing boundary conditions
- Near-to-far-field transformation
- Dispersive,nonlinear,and gain materials
- Electrodynamics of metamaterials
- Optical magnetism,left-handed optical materials
- Semicontinuous metal films
- Localization of surface plasmons
- Optical properties of metal-dielectric films
- Surface Enhanced Raman Scattering(SERS)
|
Research Projects
EXECUTED PROJECTS SPONSORED BY NATIONAL SCIENCE COUNCIL
- Negative-Refractive-Index Optical Thin Films: Fabrication, Measurement 08/01/2010~07/31/2011 and Application(1/3)
- Plasmonic Green Nanophotonics(1/3) 08/01/2010~07/31/2011
- Nano-sculptured metal thin films(3/3) 08/01/2009~07/31/2010
- Nano-sculptured metal thin films(2/3) 08/01/2008~07/31/2009
- Nano-sculptured metal thin films(1/3) 08/01/2007~07/31/2008
- The relationship among coating parameters, microstructures and optical properties of optical thin films 11/01/2006~10/31/2007
- Research of optical interference filters in UV and DUV ranges (2/2)08/01/2006~07/31/2007
- Research of optical interference filters in UV and DUV ranges(II)-The characteristics of anisotropic films and its application to UV and DUV filters( 2/2)08/01/2006~07/31/2007
- Research of optical interference filters in UV and DUV ranges (1/2) 08/01/2005~07/31/2006
- Research of optical interference filters in UV and DUV ranges(II)-The characteristics of anisotropic films and its application to UV and DUV filters(1/2) 08/01/2005~07/31/2006
- Research of optical interference filters in UV and DUV ranges-The characteristics of anisotropic films and its application to UV and DUV filters (I)08/01/2004~07/31/2005
- Surface Plasmon Resonance to Investigate the Optical Properties of Thin Film Columnar Structure and Its Application on Biosensor Technology (II) 08/01/2003~07/31/2004
- Surface Plasmon Resonance to Investigate the Optical Properties of Thin Film Columnar Structure and Its Application on Biosensor Technology 08/01/2002~07/31/2003
- Measure Optical Properties of Anisotropic Material and Thin Films by Interference Method 06/01/2002~05/31/2003
|
Equipments
Thermal Evaporator
(Optical Thin Film Design)
|
Attenuated Total Reflectrometer
(Surface Plasma Measurement)
|
Spectrometer
(Transmission,UV, VIS wavelength)
|
|
|
Group Member
Graduate Student
Undergraduate Student
|